Solar photovoltaic (PV) generation has seen significant growth in 2021, with an increase of around 22% and exceeding 1000 TWh. However, this has also led to reliability and durability issues, particularly potential induced degradation (PID), which can reduce module output by up to 30%. This study uses cell- and module-level analysis to investigate the impact of superstrate, encapsulant, and substrate on PID.The influence of different substrates and encapsulants is studied using one-cell modules, showing that substrates with poor water-blocking properties can worsen PID, and encapsulants with lower volumetric resistance can conduct easily under damp conditions, enabling PID mechanisms (results show maximum degradation of 9%). Applying an anti-soiling coating on the front glass (superstrate) reduces PID by nearly 53%. Typical superstrates have sodium which accelerates the PID process, and therefore, using such coatings can lessen the PID problem. At the module level, the study examines the influence of weakened interface adhesion strengths in traditional Glass-Backsheet (GB) and emerging Glass-Glass (GG) (primarily bifacial modules) constructions. The findings show nearly 64% more power degradation in GG modules than in GB. Moreover, the current methods for detecting PID use new modules, which can give inaccurate information instead of DH-stressed modules for PID testing, as done in this work. A comprehensive PID susceptibility analysis for multiple fresh bifacial constructions shows significant degradation from 20 to 50% in various constructions. The presence of glass as the substrate exacerbates the PID problem due to more ionic activity available from the two glass sides. Recovery experiments are also conducted to understand the extent of the PID issue. Overall, this study identifies, studies, and explains the impact of superstrate, substrate, and encapsulant on the underlying PID mechanisms. Various pre- and post-stress characterization tests, including light and dark current-voltage (I-V) tests, electroluminescence (EL) imaging, infrared (IR) imaging, and UV fluorescence (UVF) imaging, are used to evaluate the findings. This study is significant as it provides insights into the PID issues in solar PV systems, which can help improve their performance and reliability.

Potential-Induced Degradation (PID) is an extremely serious photovoltaic (PV) durability issue significantly observed in crystalline silicon PV modules due to its rapid power degradation, particularly when compared to other PV degradation modes. The focus of this dissertation is to understand PID mechanisms and to develop PID-free cells and modules. PID-affected modules have been claimed to be fully recovered by high temperature and reverse potential treatments. However, the results obtained in this work indicate that the near-full recovery of efficiency can be achieved only at high irradiance conditions, but the full recovery of efficiency at low irradiance levels, of shunt resistance, and of quantum efficiency (QE) at short wavelengths could not be achieved. The QE loss observed at short wavelengths was modeled by changing the front surface recombination velocity. The QE scaling error due to a measurement on a PID shunted cell was addressed by developing a very low input impedance accessory applicable to an existing QE system. The impacts of silicon nitride (SiNx) anti-reflection coating (ARC) refractive index (RI) and emitter sheet resistance on PID are presented. Low RI ARC cells (1.87) were observed to be PID-susceptible whereas high RI ARC cells (2.05) were determined to be PID-resistant using a method employing high dose corona charging followed by time-resolved measurement of surface voltage. It has been demonstrated that the PID could be prevented by deploying an emitter having a low sheet resistance (~ 60 /sq) even if a PID-susceptible ARC is used in a cell. Secondary ion mass spectroscopy (SIMS) results suggest that a high phosphorous emitter layer hinders sodium transport, which is responsible for the PID. Cells can be screened for PID susceptibility by illuminated lock-in thermography (ILIT) during the cell fabrication process, and the sample structure for this can advantageously be simplified as long as the sample has the SiNx ARC and an aluminum back surface field. Finally, this dissertation presents a prospective method for eliminating or minimizing the PID issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin, and flexible Corning® Willow® Glass sheets or strips on the PV module glass superstrates, disrupting the current leakage path from the cells to the grounded frame.

Building applied photovoltaics (BAPV) is a major application sector for photovoltaics (PV). Due to the negative temperature coefficient of power output, the performance of a PV module decreases as the temperature of the module increases. In hot climatic conditions, such as the summer in Arizona, the operating temperature of a BAPV module can reach as high as 90°C. Considering a typical 0.5%/°C power drop for crystalline silicon (c-Si) modules, a performance decrease of approximately 30% would be expected during peak summer temperatures due to the difference between rated temperature (25°C) and operating temperature (~90°C) of the modules. Also, in a worst-case scenario, such as partial shading of the PV cells of air gap-free BAPV modules, some of the components could attain temperatures that would be high enough to compromise the safety and functionality requirements of the module and its components. Based on the temperature and weather data collected over a year in Arizona, a mathematical thermal model has been developed and presented in this paper to predict module temperature for five different air gaps (0", 1", 2", 3", and 4"). For comparison, modules with a thermally-insulated (R30) back were evaluated to determine the worst-case scenario. This thesis also provides key technical details related to the specially-built, simulated rooftop structure; the mounting configuration of the PV modules on the rooftop structure; the LabVIEW program that was developed for data acquisition and the MATLAB program for developing the thermal models. In order to address the safety issue, temperature test results (obtained in accordance with IEC 61730-2 and UL 1703 safety standards) are presented and analyzed for nine different components of a PV module, i.e., the front glass, substrate/backsheet (polymer), PV cell, j-box ambient, j-box surface, positive terminal, backsheet inside j-box, field wiring, and diode. The temperature test results obtained for about 140 crystalline silicon modules from a large number of manufacturers who tested modules between 2006 and 2009 at ASU/TÜV-PTL were analyzed and presented in this paper under three test conditions, i.e., short-circuit, open-circuit, and short-circuit and shaded. Also, the nominal operating cell temperatures (NOCTs) of the BAPV modules and insulated-back PV modules are presented in this paper for use by BAPV module designers and installers.