Threshold logic has long been studied as a means of achieving higher performance and lower power dissipation, providing improvements by condensing simple logic gates into more complex primitives, effectively reducing gate count, pipeline depth, and number of interconnects. This work proposes a new physical implementation of threshold logic, the threshold logic latch (TLL), which overcomes the difficulties observed in previous work, particularly with respect to gate reliability in the presence of noise and process variations. Simple but effective models were created to assess the delay, power, and noise margin of TLL gates for the purpose of determining the physical parameters and assignment of input signals that achieves the lowest delay subject to constraints on power and reliability. From these models, an optimized library of standard TLL cells was developed to supplement a commercial library of static CMOS gates. The new cells were then demonstrated on a number of automatically synthesized, placed, and routed designs. A two-stage 2's complement integer multiplier designed with CMOS and TLL gates utilized 19.5% less area, 28.0% less active power, and 61.5% less leakage power than an equivalent design with the same performance using only static CMOS gates. Additionally, a two-stage 32-instruction 4-way issue queue designed with CMOS and TLL gates utilized 30.6% less area, 31.0% less active power, and 58.9% less leakage power than an equivalent design with the same performance using only static CMOS gates.