Radiation Testing and Effects on NMOS Transistor Technologies
Description
This thesis project explores the TID susceptibility of 12nm FinFETs. Along with the basic effects, the mechanisms and patterns of these effects are analyzed and reported.
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2022-05
Agent
- Author (aut): Wallace, Trace
- Thesis director: Barnaby, Hugh
- Committee member: Marinella, Mathew
- Contributor (ctb): Barrett, The Honors College
- Contributor (ctb): Electrical Engineering Program
- Contributor (ctb): Dean, W.P. Carey School of Business