We present fast and robust numerical algorithms for 3-D scattering from perfectly electrical conducting (PEC) and dielectric random rough surfaces in microwave remote sensing. The Coifman wavelets or Coiflets are employed to implement Galerkin’s procedure in the method of moments (MoM). Due to the high-precision one-point quadrature, the Coiflets yield fast evaluations of the most off-diagonal entries, reducing the matrix fill effort from O(N^2) to O(N). The orthogonality and Riesz basis of the Coiflets generate well conditioned impedance matrix, with rapid convergence for the conjugate gradient solver. The resulting impedance matrix is further sparsified by the matrix-formed standard fast wavelet transform (SFWT). By properly selecting multiresolution levels of the total transformation matrix, the solution precision can be enhanced while matrix sparsity and memory consumption have not been noticeably sacrificed. The unified fast scattering algorithm for dielectric random rough surfaces can asymptotically reduce to the PEC case when the loss tangent grows extremely large. Numerical results demonstrate that the reduced PEC model does not suffer from ill-posed problems. Compared with previous publications and laboratory measurements, good agreement is observed.