Exhaustive testing is generally infeasible except in the smallest of systems. Research

has shown that testing the interactions among fewer (up to 6) components is generally

sufficient while retaining the capability to detect up to 99% of defects. This leads to a

substantial decrease in the number of tests. Covering arrays are combinatorial objects

that guarantee that every interaction is tested at least once.

In the absence of direct constructions, forming small covering arrays is generally

an expensive computational task. Algorithms to generate covering arrays have been

extensively studied yet no single algorithm provides the smallest solution. More

recently research has been directed towards a new technique called post-optimization.

These algorithms take an existing covering array and attempt to reduce its size.

This thesis presents a new idea for post-optimization by representing covering

arrays as graphs. Some properties of these graphs are established and the results are

contrasted with existing post-optimization algorithms. The idea is then generalized to

close variants of covering arrays with surprising results which in some cases reduce

the size by 30%. Applications of the method to generation and test prioritization are

studied and some interesting results are reported.