Tolerance maps for patterns of profiles
Description
This thesis contains the applications of the ASU mathematical model (Tolerance Maps, T-Maps) to the construction of T-Maps for patterns of line profiles. Previously, Tolerance Maps were developed for patterns of features such as holes, pins, slots and tabs to control their position. The T-Maps that are developed in this thesis are fully compatible with the ASME Y14.5 Standard. A pattern of square profiles, both linear and 2D, is used throughout this thesis to illustrate the idea of constructing the T-Maps for line profiles. The Standard defines two ways of tolerancing a pattern of profiles - Composite Tolerancing and Multiple Single Segment Tolerancing. Further, in the composite tolerancing scheme, there are two different ways to control the entire pattern - repeating a single datum or two datums in the secondary datum reference frame. T-Maps are constructed for all the different specifications. The Standard also describes a way to control the coplanarity of discontinuous surfaces using a profile tolerance and T-Maps have been developed. Since verification of manufactured parts relative to the tolerance specifications is crucial, a least squares fit approach, which was developed earlier for line profiles, has been extended to patterns of line profiles. For a pattern, two tolerances are specified, and the manufactured profile needs to lie within the tolerance zones established by both of these tolerances. An i-Map representation of the manufactured variation, located within the T-Map is also presented in this thesis.
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2014
Agent
- Author (aut): Rao, Shyam Subramanya
- Thesis advisor (ths): Davidson, Joseph K.
- Publisher (pbl): Arizona State University