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Title
  • Use of Spectroscopic Ellipsometry for Feedback Control During the Growth of Thin AlAs Layers
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Date Created
1999
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  • Text
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    • Copyright 1999 American Vacuum Society. Link to the original site http://scitation.aip.org/content/avs/journal/jvstb/17/3/10.1116/1.590728

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    M. Beaudoin, S. R. Johnson, M. D. Boonzaayer, Y.-H. Zhang, and B. Johs, Journal of Vacuum Science & Technology B 17, 1233 (1999)

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