Detection and Characterization of Singly Deuterated Silylene, SiHD, Via Optical Spectroscopy
Singly deuterated silylene has been detected and characterized in the gas-phase using high-resolution, two-dimensional, optical spectroscopy. Rotationally resolved lines in the 0[0 over 0][˜ over X]1A′ → [˜ over A]1A′′000X˜1A′→A˜1A″ band are assigned to both c-type perpendicular transition and additional parallel, axis-switching induced bands. The extracted rotational constants were combined with those for SiH2 and SiD2 to determine an improved equilibrium bond length, rSiH, and bond angle, θ, of 1.5137 ± 0.0003 Å and 92.04° ± 0.05°, and 1.4853 ± 0.0005 Å and 122.48° ± 0.08° for the [˜ over X]1A′(0, 0, 0) and [˜ over A]1A″(0, 0, 0) state respectively. The dispersed fluorescence consists of a long progression in the [˜ over A]1A″(0,0,0) → [˜ over X]1A′(0, ν2, 0) emission which was analyzed to produce vibrational parameters. A strong quantum level dependence of the rotationally resolved radiative decay curves is analyzed.