Conductive Bridge Random Access Memory (CBRAM) as an Analog Synapse for Neuromorphic Computing

The Deep Neural Network (DNN) is one type of a neuromorphic computing approach that has gained substantial interest today. To achieve continuous improvement in accuracy, the depth, and the size of the deep neural network needs to significantly increase. As the scale of the neural network increases, it poses a severe challenge to its hardware implementation with conventional Computer Processing Unit (CPU) and Graphic Processing Unit (GPU) from the perspective of power, computation, and memory. To address this challenge, domain specific specialized digital neural network accelerators based on Field Programmable Gate Array (FPGAs) and Application Specific Integrated Circuits (ASICs) have been developed. However, limitations still exist in terms of on-chip memory capacity, and off-chip memory access. As an alternative, Resistive Random Access Memories (RRAMs), have been proposed to store weights on chip with higher density and enabling fast analog computation with low power consumption. Conductive Bridge Random Access Memories (CBRAMs) is a subset of RRAMs, whose conductance states is defined by the existence and modulation of a conductive metal filament. Ag-Chalcogenide based Conductive Bridge RAM (CBRAM) devices have demonstrated multiple resistive states making them potential candidates for use as analog synapses in neuromorphic hardware. In this work the use of Ag-Ge30Se70 device as an analog synaptic device has been explored. Ag-Ge30Se70 CBRAM crossbar array was fabricated. The fabricated crossbar devices were subjected to different pulsing schemes and conductance linearity response was analyzed. An improved linear response of the devices from a non-linearity factor of 6.65 to 1 for potentiation and -2.25 to -0.95 for depression with non-identical pulse application is observed. The effect of improved linearity was quantified by simulating the devices in an artificial neural network. Simulations for area, latency, and power consumption of the CBRAM device in a neural accelerator was conducted. Further, the changes caused by Total Ionizing Dose (TID) in the conductance of the analog response of Ag-Ge30Se70 Conductive Bridge Random Access Memory (CBRAM)-based synapses are studied. The effect of irradiation was further analyzed by simulating the devices in an artificial neural network. Material characterization was performed to understand the change in conductance observed due to TID.