Full metadata
Title
Radiation Testing and Effects on NMOS Transistor Technologies
Description
This thesis project explores the TID susceptibility of 12nm FinFETs. Along with the basic effects, the mechanisms and patterns of these effects are analyzed and reported.
Date Created
2022-05
Contributors
- Wallace, Trace (Author)
- Barnaby, Hugh (Thesis director)
- Marinella, Mathew (Committee member)
- Barrett, The Honors College (Contributor)
- Electrical Engineering Program (Contributor)
- Dean, W.P. Carey School of Business (Contributor)
Topical Subject
Resource Type
Copyright Statement
In Copyright
Primary Member of
Peer-reviewed
No
Open Access
No
Series
Academic Year 2021-2022
Handle
https://hdl.handle.net/2286/R.2.N.165150
System Created
- 2022-04-15 10:45:40
System Modified
- 2023-01-10 11:47:14
- 1 year 10 months ago
Additional Formats