Full metadata
Title
Analog fault modeling, simulation and diagnosis
Description
The research objective is fully differential op-amp with common mode feedback, which are applied in filter, band gap, Analog Digital Converter (ADC) and so on as a fundamental component in analog circuit. Having modeled various defect and analyzed corresponding probability, defect library could be built after reduced defect simulation.Based on the resolution of microscope scan tool, all these defects are categorized into four groups of defects by both function and location, bias circuit defect, first stage amplifier defect, output stage defect and common mode feedback defect, separately. Each fault result is attributed to one of these four region defects.Therefore, analog testing algorithm and automotive tool could be generated to assist testing engineers to meet the demand of large numbers of chips.
Date Created
2014
Contributors
- Lu, Zhijian (Author)
- Ozev, Sule (Thesis advisor)
- Kiaei, Sayfe (Committee member)
- Ogras, Umit Y. (Committee member)
- Arizona State University (Publisher)
Topical Subject
Resource Type
Extent
viii, [44] p. : ill. (some col.)
Language
eng
Copyright Statement
In Copyright
Primary Member of
Peer-reviewed
No
Open Access
No
Handle
https://hdl.handle.net/2286/R.I.25169
Statement of Responsibility
by Zhijian Lu
Description Source
Viewed on Sept. 29, 2014
Level of coding
full
Note
thesis
Partial requirement for: M.S., Arizona State University, 2014
bibliography
Includes bibliographical references
Field of study: Electrical engineering
System Created
- 2014-06-09 02:19:49
System Modified
- 2021-08-30 01:33:49
- 3 years 2 months ago
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