Full metadata
Title
45-nm radiation hardened cache design
Description
Circuits on smaller technology nodes become more vulnerable to radiation-induced upset. Since this is a major problem for electronic circuits used in space applications, designers have a variety of solutions in hand. Radiation hardening by design (RHBD) is an approach, where electronic components are designed to work properly in certain radiation environments without the use of special fabrication processes. This work focuses on the cache design for a high performance microprocessor. The design tries to mitigate radiation effects like SEE, on a commercial foundry 45 nm SOI process. The design has been ported from a previously done cache design at the 90 nm process node. The cache design is a 16 KB, 4 way set associative, write-through design that uses a no-write allocate policy. The cache has been tested to write and read at above 2 GHz at VDD = 0.9 V. Interleaved layout, parity protection, dual redundancy, and checking circuits are used in the design to achieve radiation hardness. High speed is accomplished through the use of dynamic circuits and short wiring routes wherever possible. Gated clocks and optimized wire connections are used to reduce power. Structured methodology is used to build up the entire cache.
Date Created
2012
Contributors
- Xavier, Jerin (Author)
- Clark, Lawrence T (Thesis advisor)
- Cao, Yu (Committee member)
- Allee, David R. (Committee member)
- Arizona State University (Publisher)
Topical Subject
Resource Type
Extent
xii, 103 p. : ill. (some col.)
Language
eng
Copyright Statement
In Copyright
Primary Member of
Peer-reviewed
No
Open Access
No
Handle
https://hdl.handle.net/2286/R.I.15783
Statement of Responsibility
by Jerin Xavier
Description Source
Viewed on July 16, 2013
Level of coding
full
Note
thesis
Partial requirement for: M.S., Arizona State University, 2012
bibliography
Includes bibliographical references (p. 98-103)
Field of study: Electrical engineering
System Created
- 2013-01-17 06:32:55
System Modified
- 2021-08-30 01:44:54
- 3 years 2 months ago
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