Description
Current hard X-ray free-electron laser (XFEL) sources can deliver doses to biological macromolecules well exceeding 1 GGy, in timescales of a few tens of femtoseconds. During the pulse, photoionization can reach the point of saturation in which certain atomic species in the sample lose most of their electrons. This electronic radiation damage causes the atomic scattering factors to change, affecting, in particular, the heavy atoms, due to their higher photoabsorption cross sections. Here, it is shown that experimental serial femtosecond crystallography data collected with an extremely bright XFEL source exhibit a reduction of the effective scattering power of the sulfur atoms in a native protein. Quantitative methods are developed to retrieve information on the effective ionization of the damaged atomic species from experimental data, and the implications of utilizing new phasing methods which can take advantage of this localized radiation damage are discussed.
Details
Title
- Electronic damage in S atoms in a native protein crystal induced by an intense X-ray free-electron laser pulse
Contributors
- Galli, L. (Author)
- Son, S.-K. (Author)
- Klinge, M. (Author)
- Bajt, S. (Author)
- Barty, A. (Author)
- Bean, R. (Author)
- Betzel, C. (Author)
- Beyerlein, K. R. (Author)
- Caleman, C. (Author)
- Doak, R. B. (Author)
- Duszenko, M. (Author)
- Fleckenstein, H. (Author)
- Gati, C. (Author)
- Hunt, B. (Author)
- Kirian, R. A. (Author)
- Liang, M. (Author)
- Nanao, M. H. (Author)
- Nass, K. (Author)
- Oberthur, D. (Author)
- Redecke, L. (Author)
- Shoeman, R. (Author)
- Stellato, F. (Author)
- Yoon, C. H. (Author)
- White, T. A. (Author)
- Yefanov, O. (Author)
- Spence, John (Author)
- Chapman, H. N. (Author)
- College of Liberal Arts and Sciences (Contributor)
- Department of Physics (Contributor)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2015-04-29
Resource Type
Collections this item is in
Identifier
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Digital object identifier: 10.1063/1.4919398
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Identifier TypeInternational standard serial numberIdentifier Value2329-7778
Note
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The final version of this article, as published in Structural Dynamics, can be viewed online at: http://aca.scitation.org/doi/10.1063/1.4919398
Citation and reuse
Cite this item
This is a suggested citation. Consult the appropriate style guide for specific citation guidelines.
Galli, L., Son, S., Klinge, M., Bajt, S., Barty, A., Bean, R., . . . Chapman, H. N. (2015). Electronic damage in S atoms in a native protein crystal induced by an intense X-ray free-electron laser pulse. Structural Dynamics, 2(4), 041703. doi:10.1063/1.4919398