We report on a new numerical approach for multi-band drift within the context of full band Monte Carlo (FBMC) simulation and apply this to Si and InAs nanowires. The approach is based on the solution of the Krieger and Iafrate (KI) equations [J. B. Krieger and G. J. Iafrate, Phys. Rev. B 33, 5494 (1986)], which gives the probability of carriers undergoing interband transitions subject to an applied electric field. The KI equations are based on the solution of the time-dependent Schrödinger equation, and previous solutions of these equations have used Runge-Kutta (RK) methods to numerically solve the KI equations. This approach made the solution of the KI equations numerically expensive and was therefore only applied to a small part of the Brillouin zone (BZ). Here we discuss an alternate approach to the solution of the KI equations using the Magnus expansion (also known as “exponential perturbation theory”). This method is more accurate than the RK method as the solution lies on the exponential map and shares important qualitative properties with the exact solution such as the preservation of the unitary character of the time evolution operator. The solution of the KI equations is then incorporated through a modified FBMC free-flight drift routine and applied throughout the nanowire BZ. The importance of the multi-band drift model is then demonstrated for the case of Si and InAs nanowires by simulating a uniform field FBMC and analyzing the average carrier energies and carrier populations under high electric fields. Numerical simulations show that the average energy of the carriers under high electric field is significantly higher when multi-band drift is taken into consideration, due to the interband transitions allowing carriers to achieve higher energies.
Details
- Modeling of Multi-Band Drift in Nanowires Using a Full Band Monte Carlo Simulation
- Hathwar, Raghuraj (Author)
- Saraniti, Marco (Author)
- Goodnick, Stephen (Author)
- Ira A. Fulton Schools of Engineering (Contributor)
- Digital object identifier: 10.1063/1.4959881
- Identifier TypeInternational standard serial numberIdentifier Value0021-8979
- Identifier TypeInternational standard serial numberIdentifier Value1089-7550
- This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Journal of Applied Physics and may be found at http://aip.scitation.org/doi/10.1063/1.4959881.
Citation and reuse
Cite this item
This is a suggested citation. Consult the appropriate style guide for specific citation guidelines.
Hathwar, R., Saraniti, M., & Goodnick, S. M. (2016). Modeling of multi-band drift in nanowires using a full band Monte Carlo simulation. Journal of Applied Physics, 120(4), 044307. doi:10.1063/1.4959881